Damage Induced to DNA by Low-Energy (0−30 eV) Electrons under Vacuum and Atmospheric Conditions

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Damage induced to DNA by low-energy (0-30 eV) electrons under vacuum and atmospheric conditions.

In this study, we show that it is possible to obtain data on DNA damage induced by low-energy (0-30 eV) electrons under atmospheric conditions. Five monolayer films of plasmid DNA (3197 base pairs) deposited on glass and gold substrates are irradiated with 1.5 keV X-rays in ultrahigh vacuum and under atmospheric conditions. The total damage is analyzed by agarose gel electrophoresis. The damage...

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Damage to model DNA fragments from very low-energy (<1 eV) electrons.

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Thin films of the short single strand of DNA, GCAT, in which guanine (G) or adenine (A) have been removed, were bombarded under vacuum by 4 to 15 eV electrons. The fragments corresponding to base release and strand breaks (SB) were analyzed by high performance liquid chromatography and their yields compared with those obtained from unmodified GCAT. From such a comparison, it is shown that, usin...

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Mechanism and site of attack for direct damage to DNA by low-energy electrons.

We report results on the desorption of OH- induced by 0-19 eV electrons incident on self-assembled monolayer films made of single and double DNA strands of different orientations with respect to a gold substrate. Such measurements make it possible to deduce the mechanism and site of OH- formation within a biomolecule as complex as DNA. This type of damage is attributed to dissociative electron ...

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We overview our recent theoretical predictions and the innovative experimental findings that inspired us concerning the mechanisms by which very low-energy (0.1-2 eV) free electrons attach to DNA and cause strong (ca. 4 eV) covalent bonds to break causing so-called single-strand breaks. Our primary conclusions are that (i) attachment of electrons in the above energy range to base pi* orbitals i...

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ژورنال

عنوان ژورنال: The Journal of Physical Chemistry B

سال: 2009

ISSN: 1520-6106,1520-5207

DOI: 10.1021/jp902540k